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Highest resolution chemical imaging based on secondary ion mass spectrometry performed on the helium ion microscope
Jean-Nicolas Audinot, Patrick Philipp, Olivier De Castro, Antje Biesemeier, Quang Hung Hoang and Tom Wirtz Reports on Progress in Physics 84(10) 105901 (2021) https://doi.org/10.1088/1361-6633/ac1e32
Potential of gas-assisted time-of-flight secondary ion mass spectrometry for improving the elemental characterization of complex metal-based systems
Agnieszka Priebe, Tianle Xie, Laszlo Pethö and Johann Michler Journal of Analytical Atomic Spectrometry 35(12) 2997 (2020) https://doi.org/10.1039/D0JA00372G
The matrix effect in TOF-SIMS analysis of two-element inorganic thin films
Agnieszka Priebe, Tianle Xie, Gerhard Bürki, Laszlo Pethö and Johann Michler Journal of Analytical Atomic Spectrometry 35(6) 1156 (2020) https://doi.org/10.1039/C9JA00428A
Application of a novel compact Cs evaporator prototype for enhancing negative ion yields during FIB-TOF-SIMS analysis in high vacuum
Correlative microscopy combining transmission electron microscopy and secondary ion mass spectrometry: A general review on the state-of-the-art, recent developments, and prospects
S. Eswara, A. Pshenova, L. Yedra, Q. H. Hoang, J. Lovric, P. Philipp and T. Wirtz Applied Physics Reviews 6(2) (2019) https://doi.org/10.1063/1.5064768
U‐Th Zircon Dating by Laser Ablation Single Collector Inductively Coupled Plasma‐Mass Spectrometry (LA‐ICP‐MS)
Marcel Guillong, Jakub T. Sliwinski, Axel Schmitt, Francesca Forni and Olivier Bachmann Geostandards and Geoanalytical Research 40(3) 377 (2016) https://doi.org/10.1111/j.1751-908X.2016.00396.x
Significant Enhancement of Negative Secondary Ion Yields by Cluster Ion Bombardment Combined with Cesium Flooding
Ming L. Yu Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 15(1-6) 151 (1986) https://doi.org/10.1016/0168-583X(86)90273-9
Sputtering of a cesium-covered copper crystal: A computer simulation
Christiane Coudray and Georges Slodzian Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 15(1-6) 29 (1986) https://doi.org/10.1016/0168-583X(86)90246-6
The relative motion of ions in solution. I. Microdynamical models and intermolecular dipolar spin relaxation