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UHV high-resolution electron microscopy and chemical analysis of room-temperature Au deposition on Si(001)-2×1

E. Landree, D. Grozea, C. Collazo-Davila and L. D. Marks
Physical Review B 55 (12) 7910 (1997)
https://doi.org/10.1103/PhysRevB.55.7910

Au/Si(111) and the formation of silicides at the interface examined by spin-resolved photoemission

B. Vogt, P. Stoppmanns, B. Schmiedeskamp and U. Heinzmann
Applied Physics A Solids and Surfaces 52 (5) 323 (1991)
https://doi.org/10.1007/BF00324773

Characterization of metastable AuxSi1−x alloys

A. Cros, R. Pierrisnard, C. A. Hewett and S. S. Lau
Applied Physics Letters 53 (11) 953 (1988)
https://doi.org/10.1063/1.100079

Electron irradiation and adhesion at silicon-gold interfaces prepared under ultra high vacuum conditions

H. Dallaporta and A. Cros
Surface Science Letters 169 (2-3) L355 (1986)
https://doi.org/10.1016/0167-2584(86)91240-5

Influence of low-energy electron irradiation on the adhesion of gold films on a silicon substrate

H. Dallaporta and A. Cros
Applied Physics Letters 48 (20) 1357 (1986)
https://doi.org/10.1063/1.96908

Chemical reactions at the noble and near-noble metal/InP interfaces: Comparison to Si and GaAs

T. Kendelewicz, W. G. Petro, I. Lindau and W. E. Spicer
Applied Physics Letters 44 (11) 1066 (1984)
https://doi.org/10.1063/1.94645

Angle-resolved photoemission of the initial stages of Au growth on Si(111) 7 × 7

F Houzay, G M Guichar, A Cros, et al.
Journal of Physics C: Solid State Physics 15 (34) 7065 (1982)
https://doi.org/10.1088/0022-3719/15/34/018

Low-energy electron-loss spectroscopy and Auger-electron-spectroscopy studies of noble-metal—silicon interfaces: Si-Au system

P. Perfetti, S. Nannarone, F. Patella, et al.
Physical Review B 26 (3) 1125 (1982)
https://doi.org/10.1103/PhysRevB.26.1125

A study of the Si-Au-Ag interface by surface techniques

A. Cros, F. Salvan and J. Derrien
Journal of Applied Physics 52 (7) 4757 (1981)
https://doi.org/10.1063/1.329312

Au on Si (111): A study of the interface under UHV conditions and its modifications in air by surface techniques and MeV ion scattering

J. Derrien, C. Cohen, A. Cros, J. M. Layet, F. Salvan, F. Abel, J. C. Boulliard, J. L. Domange and M. Sotto
Applied Physics Letters 39 (11) 915 (1981)
https://doi.org/10.1063/1.92605