La fonctionnalité Article cité par… liste les citations d'un article. Ces citations proviennent de la base de données des articles de EDP Sciences, ainsi que des bases de données d'autres éditeurs participant au programme CrossRef Cited-by Linking Program . Vous pouvez définir une alerte courriel pour être prévenu de la parution d'un nouvel article citant " cet article (voir sur la page du résumé de l'article le menu à droite).
Article cité :
F. Salvan , A. Cros , J. Derrien
J. Physique Lett., 41 14 (1980) 337-340
Citations de cet article :
39 articles
Study of the growth and stability of ultra-thin films of Au deposited on Si(100) and Si(111)
J.H. Kim, G. Yang, S. Yang and A.H. Weiss Surface Science 475 (1-3) 37 (2001) https://doi.org/10.1016/S0039-6028(00)01059-1
UHV high-resolution electron microscopy and chemical analysis of room-temperature Au deposition on Si(001)-2×1
E. Landree, D. Grozea, C. Collazo-Davila and L. D. Marks Physical Review B 55 (12) 7910 (1997) https://doi.org/10.1103/PhysRevB.55.7910
Control of Semiconductor Interfaces
P. Morgen, A. Cohen Simonsen and K. Pedersen Control of Semiconductor Interfaces 371 (1994) https://doi.org/10.1016/B978-0-444-81889-8.50069-9
Properties of noble-metal/silicon junctions
A. Cros and P. Muret Materials Science Reports 8 (6-7) 271 (1992) https://doi.org/10.1016/0920-2307(92)90004-K
Properties of Au and Cu layers deposited on photoablated polyphenylquinoxaline surfaces
A. Cros, H. Dallaporta, S. Lazare, et al. Applied Surface Science 54 278 (1992) https://doi.org/10.1016/0169-4332(92)90056-4
Influence of epitaxy on the low temperature silicon diffusion through gold layers
A. Cros, H. Dallaporta and J.C. Oberlin Applied Surface Science 56-58 434 (1992) https://doi.org/10.1016/0169-4332(92)90266-Z
The role of epitaxy in Au-Si eutectic bonding
A. Cros and C. Canella Journal of Adhesion Science and Technology 5 (12) 1041 (1991) https://doi.org/10.1163/156856191X00035
Au/Si(111) and the formation of silicides at the interface examined by spin-resolved photoemission
B. Vogt, P. Stoppmanns, B. Schmiedeskamp and U. Heinzmann Applied Physics A Solids and Surfaces 52 (5) 323 (1991) https://doi.org/10.1007/BF00324773
The role of surface phases in processes on silicon surfaces
V.G Lifshits, V.B Akilov, B.K Churusov and Yu.L Gavriljuk Surface Science 222 (1) 21 (1989) https://doi.org/10.1016/0039-6028(89)90331-2
Characterization of metastable AuxSi1−x alloys
A. Cros, R. Pierrisnard, C. A. Hewett and S. S. Lau Applied Physics Letters 53 (11) 953 (1988) https://doi.org/10.1063/1.100079
Electron irradiation and adhesion at silicon-gold interfaces prepared under ultra high vacuum conditions
H. Dallaporta and A. Cros Surface Science Letters 169 (2-3) L355 (1986) https://doi.org/10.1016/0167-2584(86)91240-5
Influence of low-energy electron irradiation on the adhesion of gold films on a silicon substrate
H. Dallaporta and A. Cros Applied Physics Letters 48 (20) 1357 (1986) https://doi.org/10.1063/1.96908
Atomic bonding at the SiAu and SiCu interfaces
H. Dallaporta and A. Cros Surface Science 178 (1-3) 64 (1986) https://doi.org/10.1016/0039-6028(86)90281-5
Electron irradiation and adhesion at silicon-gold interfaces prepared under ultra high vacuum conditions
H. Dallaporta and A. Cros Surface Science 169 (2-3) L355 (1986) https://doi.org/10.1016/0039-6028(86)90606-0
7 × 7 Si(111)Cu interfaces: Combined LEED, AES and EELS measurements
E. Daugy, P. Mathiez, F. Salvan and J.M. Layet Surface Science 154 (1) 267 (1985) https://doi.org/10.1016/0039-6028(85)90365-6
Electronic properties on silicon-transition metal interface compounds
C. Calandra, O. Bisi and G. Ottaviani Surface Science Reports 4 (5-6) 271 (1985) https://doi.org/10.1016/0167-5729(85)90005-6
Chemical reactions at the noble and near-noble metal/InP interfaces: Comparison to Si and GaAs
T. Kendelewicz, W. G. Petro, I. Lindau and W. E. Spicer Applied Physics Letters 44 (11) 1066 (1984) https://doi.org/10.1063/1.94645
Electronic properties of cleaved Si(111) upon room-temperature deposition of Au
A. Taleb-Ibrahimi, C.A. Sébenne, D. Bolmont and P. Chen Surface Science 146 (1) 229 (1984) https://doi.org/10.1016/0039-6028(84)90239-5
Interaction of gold, palladium and Au-Pd alloy deposits with oxidized Si(100) substrates
R. Anton Thin Solid Films 120 (4) 293 (1984) https://doi.org/10.1016/0040-6090(84)90244-X
Angle resolved photoemission measurements on Ag-Si(111) 7 × 7 interfaces
F. Houzay, G.M. Guichar, A. Cros, et al. Surface Science Letters 124 (1) L1 (1983) https://doi.org/10.1016/0167-2584(83)90805-8
Surfaces and Interfaces: Physics and Electronics
G. LE LAY Surfaces and Interfaces: Physics and Electronics 169 (1983) https://doi.org/10.1016/B978-0-444-86784-1.50019-5
Physics and electronics of the noble-metal/elemental-semiconductor interface formation: A status report
G. Le Lay Surface Science 132 (1-3) 169 (1983) https://doi.org/10.1016/0039-6028(83)90537-X
A photoemission investigation of the Si-Au interface and its behaviour under oxygen exposure
J. Derrien and F. Ringeisen Surface Science Letters 124 (2-3) L35 (1983) https://doi.org/10.1016/0167-2584(83)90769-7
A photoemission investigation of the Si-Au interface and its behaviour under oxygen exposure
J. Derrien and F. Ringeisen Surface Science 124 (2-3) L35 (1983) https://doi.org/10.1016/0039-6028(83)90789-6
Electronic properties of gold-silicon (111) 7 × 7 interfaces
F. Houzay, A. Cros, F. Salvan, et al. Physica B+C 117-118 840 (1983) https://doi.org/10.1016/0378-4363(83)90669-1
Compound formation and bonding configuration at the Si-Cu interface
G. Rossi and I. Lindau Physical Review B 28 (6) 3597 (1983) https://doi.org/10.1103/PhysRevB.28.3597
Silicon surfaces : metallic character, oxidation and adhesion
A. Cros Journal de Physique 44 (6) 707 (1983) https://doi.org/10.1051/jphys:01983004406070700
The Ge/Au interface investigated with photoemission at the cooper minimum
P. Perfetti, G. Rossi, I. Lindau and O. Bisi Surface Science Letters 124 (2-3) L19 (1983) https://doi.org/10.1016/0167-2584(83)90766-1
Laser annealing of the Si-Au interface
A. Cros, J. Marfaing, F. Salvan, J. Derrien and F. Kerhervé Thin Solid Films 100 (1) 17 (1983) https://doi.org/10.1016/0040-6090(83)90225-0
Angle resolved photoemission measurements on AgSi(111) 7 × 7 interfaces
F. Houzay, G.M. Guichar, A. Cros, et al. Surface Science 124 (1) L1 (1983) https://doi.org/10.1016/0039-6028(83)90328-X
The Ge/Au interface investigated with photoemission at the cooper minimum
P. Perfetti, G. Rossi, I. Lindau and O. Bisi Surface Science 124 (2-3) L19 (1983) https://doi.org/10.1016/0039-6028(83)90786-0
Angle-resolved photoemission of the initial stages of Au growth on Si(111) 7 × 7
F Houzay, G M Guichar, A Cros, et al. Journal of Physics C: Solid State Physics 15 (34) 7065 (1982) https://doi.org/10.1088/0022-3719/15/34/018
Low-energy electron-loss spectroscopy and Auger-electron-spectroscopy studies of noble-metal—silicon interfaces: Si-Au system
P. Perfetti, S. Nannarone, F. Patella, et al. Physical Review B 26 (3) 1125 (1982) https://doi.org/10.1103/PhysRevB.26.1125
The Au/Si(111) interface: Growth mode, energetics, structural and electronic properties
G. Le Lay Journal of Crystal Growth 54 (3) 551 (1981) https://doi.org/10.1016/0022-0248(81)90512-1
Electronic structure of the Si-Au surface
C. Mouttet, J.P. Gaspard and P. Lambin Surface Science Letters 111 (3) L755 (1981) https://doi.org/10.1016/0167-2584(81)90508-9
A study of the Si-Au-Ag interface by surface techniques
A. Cros, F. Salvan and J. Derrien Journal of Applied Physics 52 (7) 4757 (1981) https://doi.org/10.1063/1.329312
Electronic structure of the SiAu surface
C. Mouttet, J.P. Gaspard and P. Lambin Surface Science 111 (3) L755 (1981) https://doi.org/10.1016/0039-6028(81)90393-9
Au on Si (111): A study of the interface under UHV conditions and its modifications in air by surface techniques and MeV ion scattering
J. Derrien, C. Cohen, A. Cros, J. M. Layet, F. Salvan, F. Abel, J. C. Boulliard, J. L. Domange and M. Sotto Applied Physics Letters 39 (11) 915 (1981) https://doi.org/10.1063/1.92605
Catalytic action of gold atoms on the oxidation of Si(111) surfaces
A. Cros, J. Derrien and F. Salvan Surface Science 110 (2) 471 (1981) https://doi.org/10.1016/0039-6028(81)90652-X