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Cited article:

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Highest resolution chemical imaging based on secondary ion mass spectrometry performed on the helium ion microscope

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Potential of gas-assisted time-of-flight secondary ion mass spectrometry for improving the elemental characterization of complex metal-based systems

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The matrix effect in TOF-SIMS analysis of two-element inorganic thin films

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Correlative microscopy combining transmission electron microscopy and secondary ion mass spectrometry: A general review on the state-of-the-art, recent developments, and prospects

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U‐Th Zircon Dating by Laser Ablation Single Collector Inductively Coupled Plasma‐Mass Spectrometry (LA‐ICP‐MS)

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Significant Enhancement of Negative Secondary Ion Yields by Cluster Ion Bombardment Combined with Cesium Flooding

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Analytical Chemistry 87 (19) 10025 (2015)
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High-resolution high-sensitivity elemental imaging by secondary ion mass spectrometry: from traditional 2D and 3D imaging to correlative microscopy

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Nanotechnology 26 (43) 434001 (2015)
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Diffusion of cesium in silicon during SIMS experiments investigated by numerical simulations

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Surface and Interface Analysis 46 (S1) 7 (2014)
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The Chemistry of Contrast Agents in Medical Magnetic Resonance Imaging

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The Chemistry of Contrast Agents in Medical Magnetic Resonance Imaging 277 (2013)
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Negative ion yield and sputter yield variations for Cs+ bombardment of Si with O2 gas flooding

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Surface and Interface Analysis 43 (1-2) 129 (2011)
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Chemical enhancement effects in SIMS analysis

Ming L. Yu
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 15 (1-6) 151 (1986)
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Sputtering of a cesium-covered copper crystal: A computer simulation

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Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 15 (1-6) 29 (1986)
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The relative motion of ions in solution. I. Microdynamical models and intermolecular dipolar spin relaxation

P. H. Fries and G. N. Patey
The Journal of Chemical Physics 80 (12) 6253 (1984)
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Nitroxide radical induced solvent proton relaxation: Measurement of localized translational diffusion

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The Journal of Chemical Physics 81 (9) 4038 (1984)
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Local in-depth analysis of ceramic materials by neutral beam secondary ion mass spectrometry

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International Journal of Mass Spectrometry and Ion Physics 34 (3-4) 361 (1980)
https://doi.org/10.1016/0020-7381(80)85049-2