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Formation of a highly doped ultra-thin amorphous carbon layer by ion bombardment of graphene
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Graphene Enhanced Secondary Ion Mass Spectrometry (GESIMS)
Accurate Mg/Ca, Sr/Ca, and Ba/Ca ratio measurements in carbonates by SIMS and NanoSIMS and an assessment of heterogeneity in common calcium carbonate standards
Sulfur Isotope Analysis of Bitumen and Pyrite Associated with Thermal Sulfate Reduction in Reservoir Carbonates at the Big Piney-La Barge Production Complex
Measurement of SIMS Instrumental Mass Fractionation of Pb Isotopes During Zircon Dating
Richard A. Stern, Simon Bodorkos, Sandra L. Kamo, Arthur H. Hickman and Fernando Corfu Geostandards and Geoanalytical Research 33(2) 145 (2009) https://doi.org/10.1111/j.1751-908X.2009.00023.x
Composition‐Induced Variations in SIMS Instrumental Mass Fractionation during Boron Isotope Ratio Measurements of Silicate Glasses
Isotopic fractionation of sputtered anions: C− and
Hubert Gnaser Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 266(1) 37 (2008) https://doi.org/10.1016/j.nimb.2007.10.001
Mass fractionation of carbon and hydrogen secondary ions upon Cs+ and O2+ bombardment of organic materials
Shane E. Harton, Zhengmao Zhu, Frederick A. Stevie, Dieter P. Griffis and Harald Ade Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 25(3) 480 (2007) https://doi.org/10.1116/1.2718957
SIMS investigations of isotope effects at a processed solid surface
Hubert Gnaser Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 197(1-2) 49 (2002) https://doi.org/10.1016/S0168-583X(02)01468-4
Dynamical screening effects in surface ionization of mono(di)atomic fragmentation: A finite size approach
R.-J Tarento, P Joyes and J Van de Walle Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 193(1-4) 794 (2002) https://doi.org/10.1016/S0168-583X(02)00906-0
Quantitative Imaging of Stable Isotopes by Ion Microprobe
Isotopic fractionation in secondary ionization mass spectrometry
Ian C. Lyon, John M. Saxton, Grenville Turner and Richard Hinton Rapid Communications in Mass Spectrometry 8(10) 837 (1994) https://doi.org/10.1002/rcm.1290081009
An investigation of the precision of isotopic abundances determined by secondary ion mass spectrometry
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P. Gas, C. Zaring, B. G. Svensson, M. Östling, C. S. Petersson and F. M. d’Heurle Journal of Applied Physics 67(5) 2390 (1990) https://doi.org/10.1063/1.345541
Boron implantation in silicon: Isotope effects studied by secondary ion mass spectrometry
Catalyst and binder effects in the use of filamentous graphite for AMS
John S. Vogel, John R. Southon and D.Erle Nelson Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 29(1-2) 50 (1987) https://doi.org/10.1016/0168-583X(87)90202-3
Isotopic studies of Mg, Fe, Mo, Ru and W in Fremdlinge from Allende refractory inclusions
Bombardment-induced Gibbsian segregation and its role in secondary ion formation
Roger Kelly Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 14(4-6) 421 (1986) https://doi.org/10.1016/0168-583X(86)90137-0
Secondary Ion Mass Spectrometry SIMS V
U. Södervall, H. Odelius, A. Lodding, et al. Springer Series in Chemical Physics, Secondary Ion Mass Spectrometry SIMS V 44 41 (1986) https://doi.org/10.1007/978-3-642-82724-2_7
Quantitative major- and trace-element whole-rock analyses by secondary-ion mass spectrometry using the specimen isolation technique